Part Number List of NSN 5962-01-377-1128, 5962013771128 - Microcircuit Memory
The NSN part number 5962-01-377-1128 manufactured by Bae Systems Controls Inc, Dla Land And Maritime is available in NSN Components’ inventory. Owned and operated by ASAP Semiconductor, we have an inventory of over six billion parts, including NSN Parts 639160-01, 5962-8605304LA, 5692-8605304LA. ASAP is dedicated to streamlining the parts procurement process for our customers, with dedicated account managers ready to solve procurement issues that they face. Each NSN 5962-01-377-1128 part of Microcircuit Memory we ship goes through numerous quality checks and inspections, to ensure we sell only the highest-quality parts. Ready to start? Then submit a Request for Quote from this page today.
| Alternative NSN: 5962-01-377-1128 |
| Federal Supply Class (FSC): 5962 Microcircuits Electronic |
| NIIN: 013771128 |
| NCB Code: USA (01) |
| Manufacturers: Bae Systems Controls Inc, Dla Land And Maritime |
Part Number's List for NSN 5962-01-377-1128, 5962013771128
| Part No | Manufacturer | Item Name | QTY | RFQ |
|---|---|---|---|---|
| 639160-01 | bae systems controls inc | microcircuit memory | Avl | RFQ |
| 5962-8605304LA | dla land and maritime | microcircuit memory | Avl | RFQ |
| 5692-8605304LA | dla land and maritime | microcircuit memory | Avl | RFQ |
Product Characteristics of NSN 5962013771128
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAT | BODY WIDTH | 0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQZP | INPUT CIRCUIT PATTERN | 22 INPUT |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-9 MIL-M-38510 |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| TTQY | TERMINAL TYPE AND QUANTITY | 24 PRINTED CIRCUIT |
| ADAU | BODY HEIGHT | 0.185 INCHES MAXIMUM |
| CBBL | FEATURES PROVIDED | HIGH IMPEDANCE AND ASYNCHRONOUS AND W/CLOCK AND W/RESET AND BIDIRECTIONAL AND BIPOLAR AND PROGRAMMED |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
| CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
| AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CZEQ | TIME RATING PER CHACTERISTIC | 20.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT AND 20.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT |
| CZER | MEMORY DEVICE TYPE | PAL |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 200.00 MILLIAMPERES MAXIMUM SUPPLY |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | REGISTERED AND-OR GATE ARRAY - INVALID MEMORY ACCESS DETECTOR |
| ADAQ | BODY LENGTH | 1.280 INCHES MAXIMUM |
| AEHX | MAXIMUM POWER DISSIPATION RATING | 1.2 WATTS |
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